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IJEETC 2025 Vol.14(5): 274-281
doi: 10.18178/ijeetc.14.5.274-281

Phishing Detection Techniques: Exploring Machine Learning and Deep Learning Models

Hadi S. Hadi and Ahmed J. Obaid*
Faculty of Computer Science and Mathematics, University of Kufa, Iraq
Email: hadis.alhasan@student.uokufa.edu.iq (H.S.H.), ahmedj.aljanaby@uokufa.edu.iq (A.J.O.)
*Corresponding author

Manuscript received April 5, 2025; revised May 25, 2025; accepted June 21, 2025

Abstract—The number of Internet users has increased significantly in recent years, driven by the growing popularity of online education, e-commerce, and other digital services. E-commerce, in particular, has seen significant growth due to increasing consumer demand for a convenient and secure online shopping experience. The COVID-19 pandemic has significantly sped up the uptake of e-commerce, changing consumer habits and propelling online transactions at an extraordinary rate. Nevertheless, this swift digital shift has heightened vulnerability to cyber threats, resulting in a significant rise in phishing attacks targeting the theft of confidential user data. In this article, we explore the use of Machine Learning (ML) and Deep Learning (DL) methods for detecting phishing, emphasizing conventional models, ensemble techniques, and hybrid systems. We analyze the key obstacles in this domain, such as data imbalance, significant computational expenses, and the challenges of real-time applications. Regarding research, this research emphasizes the potential of hybrid models and advanced methods to enhance the accuracy, efficiency, and scalability of Phishing systems. This result emphasizes the urgent need for a reliable, adaptive, and flexible detection system in order to express the growing risk of personal and organizational security in the digital development environment and to fight the increase in phishing attack.

 
Index Terms—phishing detection, machine learning, deep learning, ensemble models, hybrid approaches

Cite: Hadi S. Hadi and Ahmed J. Obaid, "Phishing Detection Techniques: Exploring Machine Learning and Deep Learning Models," International Journal of Electrical and Electronic Engineering & Telecommunications, Vol. 14, No. 5, pp. 274-281, 2025. doi: 10.18178/ijeetc.14.5.274-281

Copyright © 2025 by the authors. This is an open access article distributed under the Creative Commons Attribution License (CC BY 4.0), which permits use, distribution and reproduction in any medium, provided that the article is properly cited, the use is non-commercial and no modifications or adaptations are made.

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