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IJEETC 2022 Vol.11(4): 249-261
doi: 10.18178/ijeetc.11.4.249-261

Metrological Applications of Optical Reflectometry: A Review

Yuri A. Konstantinov, Fedor L. Barkov, and Roman S. Ponomarev

Yuri A. Konstantinov 1, Fedor L. Barkov 2, and Roman S. Ponomarev 3
1. Perm Federal Research Center, Ural Branch, Russian Academy of Sciences, Perm, Russia
2. Program Committee of International conference “Optical Reflectometry Metrology and Sensing”, Perm, Russia
3. Perm State National Research University, Perm, Russia

Abstract—This paper describes the state-of-art features of special optical fibers and integrated-optical circuits distributed parameters study by methods of optical reflectometry. Attention is paid to the study of the internal structure of fibers that preserve the polarization of the introduced radiation, active optical fibers, and waveguides inside the integrated chips, optical circuits, and other technological created media.
 
Index Terms—Active optical fibers, integrated optical circuits, metrology, optical reflectometry, optoelectronic circuits, special optical fibers

Cite: Yuri A. Konstantinov, Fedor L. Barkov, and Roman S. Ponomarev, "Metrological Applications of Optical Reflectometry: A Review," International Journal of Electrical and Electronic Engineering & Telecommunications, Vol. 11, No. 4, pp. 249-261, May 2022. Doi: 10.18178/ijeetc.11.4.249-261

Copyright © 2022 by the authors. This is an open access article distributed under the Creative Commons Attribution License (CC BY-NC-ND 4.0), which permits use, distribution and reproduction in any medium, provided that the article is properly cited, the use is non-commercial and no modifications or adaptations are made.